Close category search window
 

Face recognition based on fusion of Gabor and 2DPCA features

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Jian Wang ; Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China ; Jian Cheng

A new face recognition algorithm based on fusion of 2DPCA and Gabor features with DCV method is presented. The method first extracts features by employed 2DPCA and Gabor wavelets respectively. And the `z-score' method is applied to normalize the 2DPCA feature and Gabor feature. Then the 2DPCA feature is combined with the Gabor feature by the append rule. In order to overcome the small sample size (`SSS') problem, the DCV method is then applied to the combined feature vector to extract discriminate nonlinear features for recognition. Finally, Nearest Neighbor (NN) method is used to classify. Experimental results on ORL database show that the proposed method achieves higher recognition rate compared with other methods, especially, when the number of the training set is small.

Published in:
Intelligent Signal Processing and Communication Systems (ISPACS), 2010 International Symposium on

Date of Conference: 6-8 Dec. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.