By Topic

[Copyright notice]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.

The following topics are dealt with: CMOS devices; reliability; quantum power devices; compound semiconductor devices; displays; sensors; MEMS; memory technology; modelling and simulation; solid-state devices; and nanoelectronic devices.

Published in:

Electron Devices Meeting (IEDM), 2010 IEEE International

Date of Conference:

6-8 Dec. 2010