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Space Radiation Effects and Reliability Considerations for Micro- and Optoelectronic Devices

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1 Author(s)
Johnston, A.H. ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

The interplay between radiation effects and reliability is discussed for micro- and optoelectronic devices. Topics discussed include basic approaches such as burn-in and electrical screening that are used to improve component reliability, synergistic effects between reliability and radiation effects, the impact of microdose damage from heavy ions on reliability of high-density digital circuits, and assessing the overall risk to components in space that are subjected to overstress conditions.

Published in:

Device and Materials Reliability, IEEE Transactions on  (Volume:10 ,  Issue: 4 )