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Embedded DRAM in 45-nm Technology and Beyond

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4 Author(s)
Anand, D.L. ; Microelectron. Div., IBM, Essex Junction, VT, USA ; Gorman, K.W. ; Jacunski, M.D. ; Paparelli, A.J.

As power and density requirements for embedded memories grow, products ranging from mobile applications to high-performance microprocessors are increasingly looking toward eDRAM as an alternative to SRAM. This article describes the state of the art in eDRAM architecture and design with a particular focus on test challenges and solutions.

Published in:

Design & Test of Computers, IEEE  (Volume:28 ,  Issue: 1 )