Cart (Loading....) | Create Account
Close category search window
 

On the intermetallic corrosion of Cu-Al wire bonds

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

18 Author(s)

A detailed description of the Cu-Al wire bond interface is presented, which can possibly explain the often observed corrosion failures in humidity reliability tests. Using micro-structural analysis techniques, it is shown that the unstressed interface contains up to three intermetallic phases, where the Cu-rich phases are located at the Cu-ball interface. Upon humidity stress test only the high-Cu containing intermetallic layers close to the Cu wire ball bond undergo a corrosion process, whilst the Cu-lean layers are stable in all environment stress tests. The failing layers consist out of an amorphous Al-based oxide matrix with embedded Cu precipitates. The failure process can be explained as galvanic corrosion of the intermetallic phases. The Cu-rich phases corrode faster compared to Al-rich phases, since they have an electrochemical potential lower than the Cu cathode and form, hypothetically, a less stable self-passivation oxide. The observed time-to-failure is then determined by the composition, thickness and volume of the intermetallic layers. This was verified by reliability test results performed on open wire bonds and on plastic encapsulated products.

Published in:

Electronics Packaging Technology Conference (EPTC), 2010 12th

Date of Conference:

8-10 Dec. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.