Cart (Loading....) | Create Account
Close category search window
 

Comparison between Neural Network Steganalysis and Linear Classification Method Stegdetect

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Holoska, J. ; Fac. of Appl. Inf., Tomas Bata Univ. in Zlin Nad, Zlin, Czech Republic ; Oplatkova, Z. ; Zelinka, I. ; Senkerik, R.

Steganography is an additional method leading to better securing messages up which goes hand by hand with the cryptography. This is the reason why revealing of such a message is difficult because a final steganogram uses multimedia or other transportation media along with genuine functionality. This paper deals with a blind steganalysis based on a universal neural network classification and compares it to Stegdetect - a linear classification tool. The results show that neural networks were better than the linear classification tool. The worst result was 1% in the case of neural network compared to Stegdetect where 4% was normal and 7.5% was the worst one on the same samples.

Published in:

Computational Intelligence, Modelling and Simulation (CIMSiM), 2010 Second International Conference on

Date of Conference:

28-30 Sept. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.