Cart (Loading....) | Create Account
Close category search window
 

Network troubleshooting with Mirror VNets

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Wundsam, A. ; Deutsche Telekom Labs., Tech. Univ. Berlin, Berlin, Germany ; Mehmood, A. ; Feldmann, A. ; Maennel, O.

Today diagnosing problems, deploying new services, testing protocol interactions, or validating network configurations are still largely unsolved problems for both enterprise and Internet Service Provider (ISP) networks. Due to the intrinsically distributed nature of network state, frequent timing dependencies, and sources of non-determinism involved, any change may introduce undesired effects-even the impact of a simple configuration change can be hard to predict. In this paper we show how to leverage network virtualization to improve our debugging ability: By replicating and cloning production networks and then applying the changes to the cloned network in a safe fashion. Mirror VNets thus enable troubleshooting as well as safe upgrades to both software and configuration.

Published in:

GLOBECOM Workshops (GC Wkshps), 2010 IEEE

Date of Conference:

6-10 Dec. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.