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Capturing skin effect with an effective nonuniform mesh and coupled R-L circuits

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5 Author(s)
Song, Z. ; EMC Lab., Beihang Univ. (BUAA), Beijing, China ; Yahyaoui, W. ; Duval, F. ; Su, D.
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The frequency dependent inductances and resistances due to skin effect result in inaccurate solutions for electrical interconnect and package design and electromagnetic compatibility modelling. A novel nonuniform mesh approach for rectangular conductors and the calculation of resultant skin effect equivalent circuit elements are proposed. With this procedure, skin effect is effectively characterised by a parallel coupled R-L circuit network with a few elements.

Published in:

Electronics Letters  (Volume:47 ,  Issue: 2 )

Date of Publication:

January 2011

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