By Topic

Capturing skin effect with an effective nonuniform mesh and coupled R-L circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Song, Z. ; EMC Lab., Beihang Univ. (BUAA), Beijing, China ; Yahyaoui, W. ; Duval, F. ; Su, D.
more authors

The frequency dependent inductances and resistances due to skin effect result in inaccurate solutions for electrical interconnect and package design and electromagnetic compatibility modelling. A novel nonuniform mesh approach for rectangular conductors and the calculation of resultant skin effect equivalent circuit elements are proposed. With this procedure, skin effect is effectively characterised by a parallel coupled R-L circuit network with a few elements.

Published in:

Electronics Letters  (Volume:47 ,  Issue: 2 )