By Topic

Effects of errors in the resistive taper on the scattering patterns of strips

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
R. L. Haupt ; US Air Force Acad., Colorado Springs, CO, USA ; V. V. Liepa

The relationship between random errors in the resistive taper of a strip using physical optics and integral equation models is shown. Error and no-error terms are calculated for the resistivity, strip current density, and scattering patterns. It is shown that the integral equation and physical optics models produce very similar results. These models allow one to separate the error and no-error terms in the strip current density and the scattering patterns in order to study the effects of random and correlated errors in the resistive taper

Published in:

IEEE Transactions on Antennas and Propagation  (Volume:38 ,  Issue: 9 )