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We propose the use of mutation-based error injection to guide the generation of high-quality diagnostic test patterns. A software-based fault localization technique is employed to derive a ranked candidate list of suspect statements. Experimental results for a set of Verilog designs demonstrate that a finer diagnostic resolution can be achieved by patterns generated by the proposed method.
Test Conference (ITC), 2010 IEEE International
Date of Conference: 2-4 Nov. 2010