Referenced Items are not available for this document.
The paper presents a new power-aware test scheme compatible with a newly proposed test compression environment based on deterministic clustering of test cubes with conflicts. The key contribution is a flexible test application framework that achieves significant reductions in switching activity during scan loading by means of a tri-modal test data decompressor.
Published in:
Test Conference (ITC), 2010 IEEE International
Date of Conference: 2-4 Nov. 2010
- Page(s):
- 1 - 10
- ISSN :
- 1089-3539
- Print ISBN:
- 978-1-4244-7206-2
- INSPEC Accession Number:
- 11773266
- Conference Location :
- Austin, TX
- Digital Object Identifier :
- 10.1109/TEST.2010.5699274
- Product Type:
- Conference Publications
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