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Bit-flipping BIST

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2 Author(s)
H. -J. Wunderlich ; Comput. Archit. Lab., Stuttgart Univ., Germany ; G. Kiefer

A scan-based BIST scheme is presented which guarantees complete fault coverage with very low hardware overhead. A probabilistic analysis shows that the output of an LFSR which feeds a scan path has to be modified only at a few bits in order to transform the random patterns into a complete test set. These modifications may be implemented by a bit-flipping function which has the LFSR-state as an input, and flips the value shifted into the scan path at certain times. A procedure is described for synthesizing the additional bit-flipping circuitry, and the experimental results indicate that this mixed-mode BIST scheme requires less hardware for complete fault coverage than all the other scan-based BIST approaches published so far.

Published in:

Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on

Date of Conference:

10-14 Nov. 1996