Close category search window
 

VSECURE: Active & standby subthreshold leakage current reduction technique

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
3 Author(s)
Neema, V. ; Dept. of E&TC, IET-Devi Ahilya Univ., Indore, India ; Chouhan, S.S. ; Sanjiv Tokekar

Cell phones and pocket PCs have burst-mode type integrated circuits, which for the majority of the time are in an idle state. For such circuits, it is acceptable to have leakage during the active mode. However, during the idle state it is extremely wasteful to have leakage, as power is unnecessarily consumed with no useful work being done. In this paper, we proposed a novel leakage reduction technique useful in reduction of leakage currents in active & standby mode and then compare and contrast it with other well established leakages currents reduction techniques. A high threshold connecting transistor is used to reduce leakage effects in complementary CMOS transistors of inverter. To maintain the performance of inverter an auxiliary NMOS is configured as a sleep transistor with PDN. Experiments conducted on a proposed inverters using 0.18 μm TSMC® using TANNER EDA tool. Results obtained shows significant reduction in leakage power and delay when compared to other techniques.

Published in:
Microelectronics (ICM), 2010 International Conference on

Date of Conference: 19-22 Dec. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.