Cart (Loading....) | Create Account
Close category search window
 

Understanding of Internal Clustering Validation Measures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Yanchi Liu ; Sch. of Econ. & Manage., Univ. of Sci. & Technol. Beijing, Beijing, China ; Zhongmou Li ; Hui Xiong ; Xuedong Gao
more authors

Clustering validation has long been recognized as one of the vital issues essential to the success of clustering applications. In general, clustering validation can be categorized into two classes, external clustering validation and internal clustering validation. In this paper, we focus on internal clustering validation and present a detailed study of 11 widely used internal clustering validation measures for crisp clustering. From five conventional aspects of clustering, we investigate their validation properties. Experiment results show that S_Dbw is the only internal validation measure which performs well in all five aspects, while other measures have certain limitations in different application scenarios.

Published in:

Data Mining (ICDM), 2010 IEEE 10th International Conference on

Date of Conference:

13-17 Dec. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.