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This work proposes a power supply noise reduction technique for at-speed testing in the broadcast-based test compression environment. The core technology is the X-slice creation technique, it comprises the scan-chain skew-insertion hardware and the skew configuration generation algorithm. With the created X-slices, the efficiency of X-slice filling to lower the launch cycle switching activity is improved. Effectiveness of the proposed technique is validated with ISCAS89 and ITC99 benchmark circuits.