Close category search window
 

Analysis of communications reliability in a multi-node virtual HF network

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mew, G.R. ; Rockwell Australia, North Ryde, NSW, Australia ; Bittel, R.H.

This paper presents an approach to determining the reliability of communications over a required area of coverage for a four node virtual HF network that interconnects a terrestrial based user with a mobile platform. It then offers a unique metric, the grade of service (GOS), for determining the capability (probability of reliability) of communicating between the network and the mobile platform. The paper presents the statistical analytical approach used to determine the reliability of communications and shows how the GOS can be determined from this reliability. This GOS is presented as a contour map over a given area of interest. This paper also investigates some of the idiosyncrasies associated with the Advanced Stand Alone Prediction System (ASAPS) program for the determination of HF propagation

Published in:
Military Communications Conference, 1996. MILCOM '96, Conference Proceedings, IEEE  (Volume:2 )

Date of Conference: 21-24 Oct 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.