Referenced Items are not available for this document.
We directly measured neutron-reaction-induced charges in the silicon surface region using silicon-on-insulator (SOI) test structures. Because the neutron beam used has an energy spectrum similar to that of sea-level atmospheric neutrons, our charge collection data correspond to those induced by cosmic ray neutrons. Measured charge collection spectra were dependent on the SOI thickness and agreed with simulated results. An application for the neutron-induced upset rate prediction was also discussed. Furthermore, the charge collection components were separated by our charge collection simulator
Published in:
Nuclear Science, IEEE Transactions on
(Volume:44
,
Issue:
2
)
Date of Publication: Apr 1997
- Page(s):
- 173 - 178
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 5569191
- Digital Object Identifier :
- 10.1109/23.568799
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Apr 1997
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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