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Fatigue Insensitivity of Nanoscale Freestanding Aluminum Films

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3 Author(s)
Kumar, S. ; Mech. & Nucl. Eng. Dept., Pennsylvania State Univ., University Park, PA, USA ; Alam, M.T. ; Haque, M.A.

We demonstrate a microelectromechanical-system-based setup for fatigue studies on 200-nm-thick freestanding aluminum specimens in situ inside the transmission electron microscope. The specimens did not show any sign of fatigue damage even at 1.2 ×106 cycles under nominal stresses about 80% of the static ultimate strength. We show direct evidence to propose that the conventional theory of fatigue crack nucleation through slip bands does not work for nanoscale freestanding thin films, which gives rise to the anomalous fatigue insensitivity.

Published in:

Microelectromechanical Systems, Journal of  (Volume:20 ,  Issue: 1 )

Date of Publication:

Feb. 2011

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