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Terahertz Characterization of External Resonant Systems by High- T_{c} Josephson Junctions

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5 Author(s)
Volkov, O.Y. ; Kotel''nikov Inst. of Radioengineering & Electron., RAS, Moscow, Russia ; Divin, Y.Y. ; Gubankov, V.N. ; Gundareva, I.I.
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High-Tc Josephson technology looks promising for THz applications. One of the remaining problems, important both for detection and emission of THz radiation, is an optimum coupling of high-Tc junctions with environment. Recently, we have demonstrated a possibility to characterize electromagnetic systems integrated with high-Tc junctions using dc I-V curves of these junctions. Here, we report in details on modification of the dc I-V curves of YBa2Cu3O7-x bicrystal junctions, related to interaction of Josephson oscillations with terahertz resonance antennas. Thin-film log-periodic antennas with various resonance structures were fabricated on the same substrate as Josephson junctions and were excited by Josephson oscillations. Frequency-dependent admittances of the antennas were derived from fine log-periodic structures on the dc I-V curves of the junctions and compared with the results of numerical simulations. Data obtained can be used for optimization of coupling between the junctions and antennas.

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Applied Superconductivity, IEEE Transactions on  (Volume:21 ,  Issue: 3 )