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Analytical Analysis of Side-Polished Plastic Optical Fiber as Curvature and Refractive Index Sensor

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5 Author(s)
Lúcia Bilro ; I3N—Institute of Nanostructures, Nanomodelling and Nanofabrication Physics Department, University of Aveiro, Aveiro, Portugal ; Nélia Alberto ; Luis Miguel Sa ; João de Lemos Pinto
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The modeling of a side-polished plastic optical fiber as a sensor of two distinct physical parameters is presented. A comprehensive analytical study is performed using a geometric optic approach. Different details are taken into account, such as the geometric description of the sensor, the intensity profile of the emitter, and the possibility of a multireflection for a light ray at the sensitive area. The good agreement between the experimental and theoretical results validates the developed analytical model.

Published in:

Journal of Lightwave Technology  (Volume:29 ,  Issue: 6 )