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Fault tolerance in VLSI circuits

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2 Author(s)
Koren, I. ; Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA ; Singh, A.D.

The defects that can occur when manufacturing VLSI ICs and the faults that can result are described. Some commonly used restructuring techniques for avoiding defective components are discussed. Several defect-tolerant designs of memory ICs, logic ICs, and wafer-scale circuits are presented. Yield models for predicting the yield of chips with redundancy are introduced, and the optimal amount of redundancy is determined.<>

Published in:

Computer  (Volume:23 ,  Issue: 7 )