Cart (Loading....) | Create Account
Close category search window

Refractive index sensor performance based on enhanced transmission of light through perforated metallic films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Iyer, S. ; Dept. of Microelectron. & Appl. Phys., R. Inst. of Technol. (KTH), Kista, Sweden ; Lin Dong ; Popov, S. ; Friberg, A.T.

The transmission of light through a thin Au film with periodic subwavelength double nanoholes at normal incidence is analyzed numerically and compared to other conventional hole shapes. The performance of such perforated metallic films as a potential refractive index sensor is discussed.

Published in:

Communications and Photonics Conference and Exhibition (ACP), 2010 Asia

Date of Conference:

8-12 Dec. 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.