By Topic

Effects of conducted electromagnetic interference on analogue-to-digital converter

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Wan, F. ; IRSEEM/ESIGELEC - Technopo-le du Madrillet, France ; Duval, F. ; Savatier, X. ; Louis, A.
more authors

The effects of conducted electromagnetic interference on an analogue-to-digital converter (ADC) are presented by the measurement. The measurement results reveal that the DC shift behaviour of the output conversion is caused by the continuous-wave interference. The DC shift behaviour produces a novel failure criterion for the immunity measurement of the ADC.

Published in:

Electronics Letters  (Volume:47 ,  Issue: 1 )