By Topic

Design for testability: today and in the future

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Williams, T.W. ; Technol. Products, IBM Corp., Boulder, CO, USA

Summary form only given. The author reviews the current techniques with a particular emphasis on today's Scan Designs. This entails distinguishing the differences between scan techniques, since all scans are not created equal! From this point the Testability Standards are discussed; these include the Boundary Scan activities and the Analog activities. Fault models are taking on more robust attributes, since the Stuck-At-Fault is necessary but not sufficient in today's technologies. The Delay Fault models are discussed with a comparison between a model which increases exponentially with gate count (Path Delay Fault) and one which increases linearly with gate count (Gate Delay Fault). Clearly, self-test is taking on an ever more important role which impacts both manufacturing testing and field system testing. The popular self-testing design techniques are shown. The interaction of testing and synthesis is discussed with a view on delay. Finally, the role of testing is explored in the new design environments which includes Hardware and Software Codesign

Published in:

VLSI Design, 1997. Proceedings., Tenth International Conference on

Date of Conference:

4-7 Jan 1997