By Topic

Electro-Mechanical Property Investigation of Striated REBCO Coated Conductor Tapes in Pure Torsion Mode

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Hyung-Seop Shin ; Sch. of Mech. Eng., Andong Nat. Univ., Andong, South Korea ; Dedicatoria, M.J. ; Kim, H.S. ; Lee, N.J.
more authors

In superconducting cable applications using the HTS tapes, striation of ReBCO coated conductor (CC) is being considered to reduce ac loss. The striation of ReBCO coating film with laser patterned filaments has been tried. In practical applications, the striated ReBCO CC tapes should also exhibit acceptable tolerance to mechanical stress/strains. However, reports on the electromechanical properties of striated CC tapes in bending or torsion mode are limited. In this study, the critical current degradation behavior of the striated Cu stabilized SmBCO CC tapes in pure torsion mode was investigated using a sample holder which gives torsional deformation to CC tapes. The CC tape has been laser scribed to produce multi-filaments. The Ic/Ic0 and n-value-torsional angle (θ) behaviors in the striated SmBCO CC tapes were examined and compared with the case of non-striated ones. According to the location of the coating film strip striated within the cross-section, there existed some difference in the Icf degradation behavior indicating that a non-uniform deformation was induced on each striated strip.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:21 ,  Issue: 3 )