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A Feature-Based Solution to Forward Problem in Electrical Capacitance Tomography of Conductive Materials

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3 Author(s)
Abdelrahman, M.A. ; Frank H. Dotterweich Coll. of Eng., Texas A&M Univ.-Kingsville, Kingsville, TX, USA ; Gupta, A. ; Deabes, W.A.

A new feature-based technique is introduced to solve the nonlinear forward problem (FP) of the electrical capacitance tomography with the target application of monitoring the metal fill profile in the lost foam casting process. The new technique is based on combining a linear solution to the FP and a correction factor (CF). The CF is estimated using an artificial neural network (ANN) trained using key features extracted from the metal distribution. The CF adjusts the linear solution of the FP to account for the nonlinear effects caused by the shielding effects of the metal. This approach shows promising results and avoids the curse of dimensionality through the use of features and not the actual metal distribution to train the ANN. The ANN is trained using nine features extracted from the metal distributions as input. The expected sensors readings are generated using ANSYS software. The performance of the ANN for the training and testing data was satisfactory, with an average root-mean-square error equal to 2.2%.

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Instrumentation and Measurement, IEEE Transactions on  (Volume:60 ,  Issue: 2 )