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Nanoscale potential measurements in liquid by frequency modulation atomic force microscopy

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3 Author(s)
Kobayashi, Naritaka ; Frontier Science Organization, Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan ; Asakawa, Hitoshi ; Fukuma, Takeshi

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We have developed a method for local potential measurements in liquid using frequency modulation atomic force microscopy. In this method, local potential is calculated from the first and second harmonic vibrations of a cantilever induced by applying an ac bias voltage between a tip and a sample. The use of an ac bias voltage with a relatively high frequency prevents uncontrolled electrochemical reactions and redistribution of ions and water. The nanoscale resolution of the method is demonstrated by imaging potential distribution of a dodecylamine thin film deposited on a graphite surface in 1 mM NaCl solution.

Published in:

Review of Scientific Instruments  (Volume:81 ,  Issue: 12 )