Cart (Loading....) | Create Account
Close category search window
 

Early sample test technique

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

Classical test pattern generator (TPG) only concern about producing maximum length of test vector. It does not consider the previous (history) of test vectors which have been generated in producing next test vectors. As a result, succeeding test vector may capture the same fault which resulted in low accumulated fault coverage. In this paper we introduced a new approach for testing both combinational circuits and sequential circuits with the aim to highlight on the importance to consider previous test vectors which have been generated in trying to capture different faults as the generation proceeds to produce consequence test vector. The proposed test method also manages to produce high fault coverage even though the test was sampled early without the need to wait till the last clock. Several experiments have been carried out on ISCAS benchmarks circuit and the results were compared with different test methods. The proposed test method proved effective, producing high fault coverage with a limited number of test vectors.

Published in:

Industrial Electronics & Applications (ISIEA), 2010 IEEE Symposium on

Date of Conference:

3-5 Oct. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.