Cart (Loading....) | Create Account
Close category search window
 

Using low-level reader data to detect false-positive RFID tag reads

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Keller, T. ; IBM Deutschland GmbH, Frankfurt, Germany ; Thiesse, F. ; Kungl, J. ; Fleisch, E.

Radio Frequency Identification (RFID) can be used in various ways for the optimization of supply chain management processes. However, there are technological constraints that delay a reliable and productive use of the technology. One of these constraints is the problem of false-positive RFID tag reads i.e., tags that have been read unintentionally by an RFID reader. We propose a machine learning based approach that makes use of the low-level reader data collected when reading tags to detect such false-positives. We evaluate our approach by verifying it with data collected in a productive RFID enabled distribution center, where it is necessary to distinguish between pallets that are loaded onto trucks and pallets that are in range of the reader by accident only. Furthermore, we identify several attributes which are expected to reveal characteristics within the low-level reader data that is typical to such false-positive reads.

Published in:

Internet of Things (IOT), 2010

Date of Conference:

Nov. 29 2010-Dec. 1 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.