Close category search window
 

Artificial Neural Network Classifier Design Using Genetic Algorithm and Wavelet Transform in Fault Diagnosis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Huiling Li ; Coll. of Electr. Power, Inner Mongolia Univ. of Technol., Hohhot, China ; Chunming Li ; Wei Wang

A diagnosis method basing on neural network classifier, genetic algorithm (GA) and wavelet transform is proposed for a pulse width modulation voltage source inverter. It is used to detect and identify the transistor open-circuit fault. BP neural network (BPNN) is capable of recognition. However, it has shortcomings obviously. These are just advantages of GA, which has ability of global search. Thus GA is integrated into BPNN for obtaining complementary advantages. Besides, Wavelet transform is employed as a fast and effective means analyzing the transient waveforms, as an alternative to the traditional Fourier transform. The Hybrid algorithm can offer higher detection efficiency and reliability.

Published in:
Information Engineering and Computer Science (ICIECS), 2010 2nd International Conference on

Date of Conference: 25-26 Dec. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.