Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Classification of Microcalcification Using Dual-Tree Complex Wavelet Transform and Support Vector Machine

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Tirtajaya, A. ; Magister Teknik Informatika, Binus Univ., Jakarta, Indonesia ; Santika, D.D.

Breast cancer is reported to be the second deadliest cancer among cancerous woman. Statistics show that the case of breast cancer in the world is increasing every year. By analyzing a mammogram, pathologists could detect the presence of micro calcification in ones breast. However, micro calcification could be classified into benign and malignant. The later indicates the presence of cancer. Computer-Aided Diagnosis (CADx) designed to help phatologists determine the type of micro calcification in a mammogram. Usually, it's consist of two steps, feature extraction and classification. In our methodology, we proposed the use of dual-tree complex wavelet transform (DT CWT) as feature extraction technique and support vector machine (SVM) as classifier. Using this methodology, our experimental result achieved good classification accuracy. However, some of the previous researches have shown better results than ours.

Published in:

Advances in Computing, Control and Telecommunication Technologies (ACT), 2010 Second International Conference on

Date of Conference:

2-3 Dec. 2010