By Topic

Exact symbol and bit error probabilities of linearly modulated signals with maximum ratio combining diversity in frequency nonselective Rician and Rayleigh fading channels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Shayesteh, M.G. ; Dept. of Electr. Eng., Urmia Univ., Urmia, Iran

The exact symbol and bit error probabilities of linearly modulated signals in frequency non-selective Rician fading channels with Lth diversity branches are derived, where coherent detection with maximum ratio combining (MRC) is used at the receiver. For performance evaluation, the multiplicative distortion is combined with the additive Gaussian noise and form an additive noise is formed. This method allows computing the exact symbol and bit error probabilities of M-ary phase shift keying (M-PSK), M-ary quadrature amplitude modulation (M-QAM), M-ary amplitude modulation (M-AM) and M-ary amplitude modulation phase modulation (M-AMPM) for any arbitrary bit mappings. The results contain several versions of one simple integral. The error probabilities are also obtained for Rayleigh channel, which is a special case of Rice channel. Further, the results for Nakagami-m channel with the integer parameter are found. The results quite match with the previous ones while having simple forms. Also, for some unsolved cases, the exact error probabilities are presented. Simulations are carried out to verify the analytical evaluations.

Published in:

Communications, IET  (Volume:5 ,  Issue: 1 )