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Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar

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7 Author(s)
Loo, Vivien ; Laboratoire de Photonique et Nanostructures, LPN/CNRS, Route de Nozay, 91460 Marcoussis, France ; Lanco, Loic ; Lemaitre, Aristide ; Sagnes, Isabelle
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We report on the coherent reflection spectroscopy of a high-quality factor micropillar, in the strong-coupling regime with a single InGaAs annealed quantum dot. The absolute reflectivity measurement is used to study the characteristics of the device at low and high excitation powers. The strong coupling is obtained with a g=16 μeV coupling strength in a 7.3 μm diameter micropillar, with a cavity spectral width κ=20.5 μeV (Q=65 000). The factor of merit of the strong-coupling regime, 4g/κ=3, is the current state-of-the-art for a quantum dot-micropillar system.

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Applied Physics Letters  (Volume:97 ,  Issue: 24 )