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Failure Mechanisms in Packaged Light-Emitting Diodes Under Gamma Radiations: Piezoelectric Model Based on Stark Effect

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6 Author(s)
Deshayes, Y. ; COFI Dept., IMS-Bordeaux Labs., Talence, France ; Baillot, R. ; Rehioui, O. ; Béchou, L.
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Degradation of packaged light-emitting diodes (LEDs) under gamma irradiations has been investigated using usual electro-optical characterizations. Failure mechanisms have been revealed by an accurate degradation model taking into account the Stark effect in electroluminescence spectrum and piezoelectric field in the active zone. Gamma irradiations have induced an additional mechanical stress close to 0.25 MPa in the active layer resulting from the change of the polymer mechanical properties used on the LED package.

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Device and Materials Reliability, IEEE Transactions on  (Volume:11 ,  Issue: 2 )