Cart (Loading....) | Create Account
Close category search window
 

High-resolution wide-field standing-wave surface plasmon resonance fluorescence microscopy with optical vortices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Tan, P.S. ; School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, 639798 Singapore ; Yuan, X.-C. ; Yuan, G.H. ; Wang, Q.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3525173 

A technique for high-resolution wide-field fluorescence microscopy by using standing surface plasmon waves induced by optical vortices (OVs) is proposed, aiming at harnessing its unique dynamic properties to sequentially illuminate specimen with different phase-shifted interference excitation field. Topological charges of the OV are employed to modulate phase-shifting of the interference pattern. Numerical studies and experimental results reveal an achievement of 0.25λ optical resolution, a factor of twofold improvement compared with the standard total-internal-reflection fluorescence microscopy.

Published in:

Applied Physics Letters  (Volume:97 ,  Issue: 24 )

Date of Publication:

Dec 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.