Notification:
We are currently experiencing intermittent issues impacting performance. We apologize for the inconvenience.
By Topic

Reducing Test Execution Cost of Integrated, Heterogeneous Systems Using Continuous Test Data

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

Integrated, heterogeneous systems are comprehensively tested to verify whether their performance specifications fall within some acceptable ranges. However, explicitly testing every manufactured instance against all of its specifications can be expensive due to the complex requirements for test setup, stimulus application, and response measurement. To reduce manufacturing test cost, we have developed a methodology that uses binary decision forests and several test-specific enhancements for identifying redundant tests of an integrated system. Feasibility is empirically demonstrated using test data from over 70 000 manufactured instances of an in-production microelectromechanical system accelerometer, and over 4 500 manufactured instances of an RF transceiver. Through our analysis, we have shown that the expensive cold-mechanical test of the accelerometer and nine out of the 22 RF tests of the transceiver are likely redundant.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:30 ,  Issue: 1 )