By Topic

Comparison of diodes and resistors for measuring chip temperature during thermal characterization of electronic packages using thermal test chips

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
A. Claassen ; Storage Syst. Div., IBM Corp., San Jose, CA, USA ; H. Shaukatullah

Thermal test chips are specially designed and built for thermal characterization of electronic packages. These chips have heaters for powering the chip and temperature sensors for measuring the chip temperature. One type of temperature sensor in wide use is a diode. Small resistors (also known as resistance temperature detectors or RTDs) are also used for measuring the chip temperature. This paper reviews and compares the characteristics of the diodes and RTDs used for chip temperature measurement during the thermal characterization of electronic packages. Techniques for reducing the measurement errors associated with these chip temperature sensors are also discussed. It is shown that the temperature versus voltage characteristics of RTDs at constant current are much more linear than those of diodes

Published in:

Semiconductor Thermal Measurement and Management Symposium, 1997. SEMI-THERM XIII., Thirteenth Annual IEEE

Date of Conference:

28-30 Jan 1997