By Topic

Analysis of software process improvement experience using the project visibility index

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

Based on the capability maturity model (CMM), process improvement at OMRON, a Japanese microprocessor manufacturer, increased project predictability in three ways: accuracy, variability, and performance. The authors use the project visibility index (PVI) and other measurements to quantitatively demonstrate this. Qualitative analysis of how and why OMRON achieved higher project visibility and increases in the QCD (quality, cost, and delivery on time) factors are supported with data on review-effort ratios and productivity. They identify factors directly affected by high project visibility

Published in:

Software Engineering Conference, 1996. Proceedings., 1996 Asia-Pacific

Date of Conference:

4-7 Dec 1996