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Mixed-mode simulation-design for IEC-ESD protection

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8 Author(s)
Fei Yao ; CitrusCom Semiconductor, China ; Xin Wang ; Shijun Wang ; Bo Qin
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Electrostatic discharge (ESD) protection becomes essential to advanced integrated circuits (IC). Very fast IEC-ESD failure and protection design are emerging challenges for contemporary ICs, particularly for consumer and portable electronics. This paper presents a new mixed-mode IEC-ESD simulation-design method, which involves process, device, circuit and system level simulation to accurately address the ultra-fast IEC ESD phenomena. The new IEC-ESD design technique allows ESD design optimization and prediction. Experimental results are depicted to validate the new design technique.

Published in:

Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on

Date of Conference:

1-4 Nov. 2010