Cart (Loading....) | Create Account
Close category search window
 

Tropospheric refractivity profiling based on refractivity profile model using single ground-based global positioning system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Lin, L.K. ; Coll. of Commun. & Inf. Eng., Nanjing Univ. of Posts & Telecommun., Nanjing, China ; Zhao, Z.W. ; Zhang, Y.R. ; Zhu, Q.L.

A retrieval method is developed to obtain atmospheric refractivity profiles based upon the zenith delay of single ground-based global positioning system receivers. It is found that the key parameter in exponential wet refractivity model is the equivalent height of wet term Hw, while the errors between the integral of the wet terms of refractivity and the true values are single-peaked functions of Hw. Therefore the golden section method is utilised to retrieve Hw; moreover, the refractivity profiles are obtained. Meanwhile, the classic Hopfield model is used as the hydrostatic refractivity model. The experimental results with radiosonde data in Shanghai, China, and simulations using data from Qingdao, China, show that this method has demonstrated a good agreement with radiosonde profiles.

Published in:

Radar, Sonar & Navigation, IET  (Volume:5 ,  Issue: 1 )

Date of Publication:

January 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.