Cart (Loading....) | Create Account
Close category search window
 

Analytical Model for Predicting Maximum Reduction Levels of Vibration and Noise in Switched Reluctance Machine by Active Vibration Cancellation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Zhu, Z.Q. ; Dept. of Electron. & Electr. Engi neering, Univ. of Sheffield, Sheffield, UK ; Liu, X. ; Zaiping Pan

High acoustic noise and vibration is one of the main drawbacks, which has limited the wide application of switched reluctance machine (SRM), especially when it is noise and vibration sensitive. Therefore, many studies have been carried out to reduce the acoustic noise and vibration of SRM. One attractive and effective method is the active vibration cancellation (AVC) proposed by Wu and Pollock, which is easy to realize without increasing any hardware. This paper presents a simple analytical method for predicting the maximum reduction levels of vibration and noise by AVC, compared with the conventional excitation. Its predicted results are then verified by experiments on a prototype 6/4 SRM.

Published in:

Energy Conversion, IEEE Transactions on  (Volume:26 ,  Issue: 1 )

Date of Publication:

March 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.