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Amorphous SiGe:H photodetectors on glass optical waveguides

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7 Author(s)
Deimel, P.P. ; Messerschmitt Bolkow-Blohm GmbH, Munchen, West Germany ; Heimhofer, B.B. ; Krotz, G. ; Lilienhof, H.J.
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Amorphous SiGe:H thin-film photodetectors integrated with ion-exchanged optical waveguides on glass are discussed. The lateral coupling between single-mode waveguide and detector is provided via an intermediate indium-tin-oxide transparent electrode located above the waveguide, followed by a p-i-n photodetector. The optical coupling between waveguide and detector depends strongly on the polarization of the incoming optical mode in the waveguide. Using a random optical bitstream in the waveguide, the detector, which is not yet optimized, responds to signals up to about 20 Mb/s NRZ (nonreturn-to-zero).<>

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Photonics Technology Letters, IEEE  (Volume:2 ,  Issue: 7 )