Cart (Loading....) | Create Account
Close category search window
 

Test Sets for Robust Path Delay Fault Testing on Two-Rail Logic Circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Namba, K. ; Grad. Sch. of Adv. Integration Sci., Chiba Univ., Chiba, Japan ; Ito, H.

The significance of redundant technologies for improving dependability and delay fault testability are growing. So, delay fault testing on two-rail logic circuits well known as a class of redundant technologies will become important. Two-rail logic circuits can be efficiently tested by noncodeword vector pairs. However, noncodeword vector pairs may sensitize some faults which affect neither normal operation nor strongly fault secure property of the two-rail logic circuits. It means that testing with noncodeword vector pairs may be overtesting. This paper presents a construction of robust path delay fault test sets for two-rail logic circuits. The proposed test sets do not lead to the overtesting. The amounts of test data for the proposed test sets are, on average, 28.2 percent less than those for the test sets, which are obtained by the existing construction for unate circuits and lead to the overtesting.

Published in:

Computers, IEEE Transactions on  (Volume:60 ,  Issue: 10 )

Date of Publication:

Oct. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.