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As is known to all, luminance and luminance distribution are both important factors influencing people's impression of the luminous environment. The traditional measuring devices are hard to meet the demand of lighting practice. A CCD-based luminance meter could evaluate the luminance of several small portions of a surface (“point” luminance). Although some manufactures have already produced reliable luminance measuring cameras, their products are quite expensive. So many research studies have been carried out on the topic of methodology developed for characterizing a commercial charge-coupled device (CCD) camera as a luminance meter. However, little attention has been paid to uncertainty of the measuring technology. This paper concerns the influence of noise of the CMOS to the dynamic range of image-based luminance measurement technology.