By Topic

Design Approach of Dynamically Reconfigurable Single Flux Quantum Logic Gates

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yamanashi, Y. ; Interdiscipl. Res. Center, Yokohama Nat. Univ., Yokohama, Japan ; Okawa, I. ; Yoshikawa, N.

Novel reconfigurable superconductive single flux quantum (SFQ) logic devices, the functions of which can be dynamically reconfigured by inputting control signals, have been investigated. The characteristics of single flux quantum circuits can be easily modulated by applying currents or magnetic fields because of the high sensitivity of superconductive circuits. We investigated several design approaches for the realization of dynamically reconfigurable SFQ logic devices. We employed direct current injection to the logic gate using a non-destructive read-out flip-flop. By changing the internal state of the non-destructive read-out flip-flop, the logic function can be dynamically reconfigured. We have designed and tested a dynamically reconfigurable Josephson transmission line (JTL)/delay flip-flop (DFF) circuit. The measured dc bias margin was 72.5-107.2%. Furthermore, we have demonstrated the operation of a variable bit-length shift register, composed of the dynamically reconfigurable JTL/DFF circuits. The investigated design approach can be applied to more sophisticated dynamically reconfigurable single flux quantum logic gates.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:21 ,  Issue: 3 )