Cart (Loading....) | Create Account
Close category search window
 

Analysis and performances of an object localization and a dimensional measurement method applied to the calibration of cameras

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Santo, C. ; Lab. GERE, Le Creusot, France ; Diou, A. ; Voisin, Y.

The calibration of a camera is an indispensable step when high precision vision is to be used as a measuring instrument. It consists in the determination of the intrinsic and extrinsic parameters of the vision system using a reference test pattern. To do this, one needs to localize and position the elements of the test pattern in the digital image with a maximum of accuracy. The objective is to obtain a resolution smaller than the dimensions of a pixel. In this context, it is necessary to implement “subpixel” precision algorithms for the localization of objects obtained by an edge detection approach. In this work, the authors have noted that the edge points are not detected in all the directions when the image is interpolated using orthogonal polynomials according to Haralick's method. Other methods have also been studied such as Canny Deriche or the spline approach. Finally, the authors have developed a method using a regression polynomial of third degree. They define, as the edge, the locus of the points for which the directional derivative is maximal. This locus is also the locus for which the second directional derivative is equal to zero. They have studied the localization and dimensional errors obtained using a test pattern consisting of circles as well as the influence of the dimension and the position of the test pattern, and of the noise and blur effects on the error. The results are analyzed and discussed

Published in:

Industrial Electronics, Control, and Instrumentation, 1996., Proceedings of the 1996 IEEE IECON 22nd International Conference on  (Volume:2 )

Date of Conference:

5-10 Aug 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.