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Combining Results of Accelerated Radiation Tests and Fault Injections to Predict the Error Rate of an Application Implemented in SRAM-Based FPGAs

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3 Author(s)
Raoul Velazco ; Laboratoire TIMA, Grenoble ; Gilles Foucard ; Paul Peronnard

An approach combining the SRAM-based field-programmable gate array static cross-section with the results of fault injection campaigns allows predicting the error rate of any implemented application. Experimental results issued from heavy ion tests are compared with predictions to validate the proposed methodology.

Published in:

IEEE Transactions on Nuclear Science  (Volume:57 ,  Issue: 6 )