By Topic

3D Reconstruction from Few Silhouettes Using Statistical Models and Landmark Points

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Prakoonwit, S. ; Sch. of Syst. Eng., Univ. of Reading, Reading, UK

3D model reconstruction is an important issue in computer graphics, computer vision and virtual reality. This paper presents a new method in rapid reconstruction of detailed 3D surface models from a small number, e.g. 3-4, of 2D silhouettes of objects taken from different views. A statistical shape model is used to fit a set of landmarks points, which are automatically created from the 2D silhouettes, to reconstruct a full detailed surface. The landmark points are optimally distributed to guarantee that the salient features of objects are included in the reconstruction process. Some proof- of-concept computational experiments have been conducted to reconstruct a test object. The results show that the proposed method is capable of reconstructing an acceptable detailed 3D surface.

Published in:

Cyberworlds (CW), 2010 International Conference on

Date of Conference:

20-22 Oct. 2010