By Topic

Improving subpixel stereo matching with segment evolution

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yao-Jen Chang ; Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA ; Hung-Hsun Liu ; Tsuhan Chen

Segmentation-based approach has shown significant success in stereo matching. By assuming pixels within one image segment belong to the same 3D surface, robust depth estimation can be achieved by taking the whole segment into consideration. However, segmentation has been mostly used for stereo matching at integer disparities rather than subpixel disparities. One major reason is that small segments may be insufficient for estimating surfaces like slanted planes, while large segments may contain segmentation errors impacting the accuracy of depth estimation. In this work, we propose a segmentation-based scheme for subpixel stereo matching. Instead of using a fixed segmentation, segments are evolved to find a better support for reliable surface estimation. Given an initial estimation of segmentation and depth, the proposed algorithm jointly optimizes the segmentation and depth by evolving the segmentation at the pixel level and updating the plane parameters at the segment level. Justified with experiments performed on the Middlebury benchmark, we show that the proposed method achieves significant improvements for subpixel stereo matching.

Published in:

Image Processing (ICIP), 2010 17th IEEE International Conference on

Date of Conference:

26-29 Sept. 2010