Close category search window
 

A novel CRC based error correction scheme in OFDM/OFDMA wireless networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Chen Chia-Yao ; Institutes of Comput. Sci. & Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan ; Jia Wen-Kang ; Chen Yaw-Chung

Recently, the Orthogonal Frequency Division Multiplexing Access (OFDM/OFDMA) based wireless transmission technology has been widely accepted by consumers. Frame Check Sequence (FCS) scheme was employed to enhance the reliability of OFDM/OFDMA systems. Since the padding overhead cannot be effectively avoided in OFDM/OFDMA when MAC frames are encapsulated. We propose a novel CRC based error correction scheme by utilizing the frame padding to carry extra segmented FCS information as much as possible; compared with legacy FCS scheme, our approach obtains a significant improvement in error detection and correction upon the first retransmission (2nd transmission). In addition, we demonstrate a significant performance improvement based on the mathematic analysis.

Published in:
Information Theory and its Applications (ISITA), 2010 International Symposium on

Date of Conference: 17-20 Oct. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.